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1

Characterization of focused ion beam induced damage

D. Vetterli, M. Do¨beli, R. Mu¨hle, P.W. Nebiker, C.R. Musil

Journal:

Microelectronic Engineering

Year:

1995

Language:

english

File:

PDF, 708 KB

english, 1995

2

Negative ions: The overlooked species in thin film growth by pulsed laser deposition

Esposito, M., Bator, M., Döbeli, M., Lippert, T., Schneider, C. W., Wokaun, A.

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 717 KB

english, 2011

3

Structure, microstructure, and high-temperature transport properties of La[sub 1−x]Ca[sub x]MnO[sub 3−δ] thin films and polycrystalline bulk materials

M. H. Aguirre, S. Canulescu, R. Robert, N. Homazava, D. Logvinovich, L. Bocher, T. Lippert, M. Döbeli, A. Weidenkaff

Year:

2008

Language:

english

File:

PDF, 924 KB

english, 2008

4

Ultraviolet electro-optic amplitude modulation in β-BaB[sub 2]O[sub 4] waveguides

Degl’Innocenti, R., Majkic, A., Vorburger, P., Poberaj, G., Günter, P., Döbeli, M.

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 589 KB

english, 2007

5

Quantitative long-range-order measurement and disordering efficiency estimation in ion-irradiated bulk Ni[sub 3]Al using cross-sectional conventional transmission electron microscopy

de Almeida, P., Schäublin, R., Almazouzi, A., Victoria, M., Döbeli, M.

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 229 KB

english, 2000

6

Selective Electrodeposition of Cu Nanostructures on Focused Ion Beam Sensitized p-Si

Spiegel, A., Staemmler, L., Döbeli, M., Schmuki, P.

Journal:

Journal of The Electrochemical Society

Year:

2002

Language:

english

File:

PDF, 1.58 MB

english, 2002

7

Minimizing damage during focused-ion-beam induced desorption of hydrogen

H. Fuhrmann, A. Candel, M. Döbeli, R. Mühle

Year:

1999

Language:

english

File:

PDF, 475 KB

english, 1999

8

Focused ion-beam structuring of Si and Si/CoSi[sub 2] heterostructures using adsorbed hydrogen as a resist

H. Fuhrmann, M. Döbeli, R. Mühle, M. Suter

Year:

1999

Language:

english

File:

PDF, 633 KB

english, 1999

9

Thin oxides on passivated silicon irradiated by focused ion beams

H. Fuhrmann, M. Döbeli, R. Kötz, R. Mühle, B. Schnyder

Year:

1999

Language:

english

File:

PDF, 493 KB

english, 1999

10

AIP Conference Proceedings [AIP The fourteenth international conference on the application of accelerators in research and industry - Denton, Texas (USA) (6-9 Nov 1996)] - Characterization of the accelerator SIMS setup at PSI/ETH Zurich

Ender, R. M., Döbeli, M., Suter, M., Synal, H.-A.

Year:

1997

File:

PDF, 712 KB

1997